- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 15/06 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring the deformation in a solid
Patent holdings for IPC class G01B 15/06
Total number of patents in this class: 93
10-year publication summary
5
|
5
|
4
|
4
|
8
|
10
|
9
|
7
|
10
|
0
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
The Boeing Company | 19843 |
7 |
NEC Corporation | 32703 |
5 |
Pulstec Industrial Co., Ltd. | 10 |
5 |
Centre National de La Recherche Scientifique | 9632 |
3 |
Ecole Normale Superieure de Cachan | 75 |
3 |
Texas Instruments Incorporated | 19376 |
2 |
Cidra Corporate Services, Inc. | 208 |
2 |
Lyten, Inc. | 238 |
2 |
Saudi Arabian Oil Company | 11322 |
2 |
University of Massachusetts | 2130 |
2 |
The University of Tokyo | 3903 |
2 |
Orica International Pte Ltd | 161 |
2 |
Iida Co., Ltd. | 8 |
2 |
Hitachi High-Tech Corporation | 4424 |
2 |
Siemens AG | 24990 |
1 |
Hitachi, Ltd. | 16452 |
1 |
Hitachi High-Technologies Corporation | 2034 |
1 |
Nikon Corporation | 7162 |
1 |
Bridgestone Corporation | 7067 |
1 |
Siemens Energy, Inc. | 1770 |
1 |
Other owners | 46 |